Miami, Florida – John Hatzis, Sr. Software Developer for RFID, will be speaking at the RFID Journal’s Virtual Event: RFID in Harsh Environments. John Hatzis will be presenting on the integration of RFID into EAM life vests through internal manufacturing processes. His session, entitled ‘RFID-Enabled Vests Improve Visibility and Traceability,' will be held on November 19, 2013 at 11:25AM Eastern.
The discussion will cover the benefits of using an RFID-enabled system to meet government regulations and ensure timely asset availability and how EAM decreased production time and reduced errors, while increasing on-time delivery.
For more information about the session and to register, visit: RFID in Harsh Environments: Virtual Event.